Porosity Characterization of Solution-Processed ITO Films by Neutron Reflectometry

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1st Paragraph: There is a large demand for transparent conducting electrodes to use in optoelectronic devices. Indium tin oxide (ITO) is still the most extensively used transparent conducting material in the world[1], because it has an excellent combination of high optical transmittance and low sheet resistance that is difficult to beat. ITO films and coatings can be mass produced by vacuum-based methods and solution-processed methods. While vacuum-based methods are typically used for commercial fabrication, solution processing methods can have advantages such as being able to use ambient conditions, have less waste and below cost [2]. However, even though similar optical properties can be easily obtained, the sheet resistivity of solution-processed ITO films is usually one order of magnitude higher than for those made by vacuum-based methods. One possible reason is the existence of air pores or inadequate contact between nanoparticles in the ITO films. A quantitative characterization of porosity can help understand the microstructure and improve the quality of solution-processed ITO films.

Authors: Ning Xia, Valeria Lauter, and Rosario A. Gerhardt

Keywords: Indium Tin Oxide, Porosity, Neutron Reflectometry

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3 pages

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