1st Paragraph: The classic method for characterizing a metal sample by SEM/EDS is to collect a single spectrum using a Si(Li) EDS detector and an analog pulse processor. This required about two minutes to collect the spectrum . During this time the SEM beam was usually set to a single spot or the beam was allowed to raster over the field of view, perhaps at very high magnification.
Author: John Konopka
Keywords: X-Ray Microanalysis, Silicon Drift Detector, Steel