Innovative SEM/EDS Characterization of Steel Facilitated by a Silicon Drift Detector

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Description

1st Paragraph: The classic method for characterizing a metal sample by SEM/EDS is to collect a single spectrum using a Si(Li) EDS detector and an analog pulse processor. This required about two minutes to collect the spectrum [1]. During this time the SEM beam was usually set to a single spot or the beam was allowed to raster over the field of view, perhaps at very high magnification.

Author: John Konopka

Keywords: X-Ray Microanalysis, Silicon Drift Detector, Steel

Additional information

Page Count

8 pages

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